电子散斑干涉条纹处理偏微分方程方法的回顾与展望

Review and Trends of Image Processing Method Based on Partial Differential Equations for Electronic Speckle Pattern Interferometry

介绍了偏微分方程(PDE)图像处理的基本原理,构造偏微分方程模型的变分法和常见的滤波模型,并给出常见滤波模型的能量泛函。回顾了近几年偏微分方程图像处理技术在电子散斑干涉(ESPI)条纹处理中的应用成果,包括应用偏微分方程图像处理方法同时实现电子散斑干涉条纹图和相位图的滤波和增强处理,提出用于密集电子散斑干涉条纹处理的方向偏微分方程模型及提取电子散斑干涉条纹骨架线的偏微分方程方法。介绍了这些方法与传统方法相比的优势,并进一步展望了偏微分方程图像处理在光测技术中的发展趋势。

The basic principle of image processing methods based on partial differential equations （PDE） is introduced, the variational methods used to derive PDE models are described, and the energy functional of widely used PDE denoising models is given. Our recent works of PDE-based image processing on electronic speckle pattern interferometry （ESPI） are reviewed, including performing contrast enhancement and denoising simultaneously for ESPI fi＇inges, proposing new oriented PDE denoising models for dense ESPI fringes and a nearly preprocessing-free method for skeletonization of gray scale ESPI fringes. The main advantages of our methods are given and some suggestions are presented for the development and the research of PDE-based image processing methods on optics test technology.