摘要
传统的智能卡测试平台需要人工干预,严重影响测试效率,因此难以满足智能卡行业的测试需求。针对这个问题,在此提出一种新的解决方案。该方案以PC/SC为编程接口,实现了测试平台与智能卡的通信,利用扩展的TCL解释器定义了一种新的测试语言ATP,它包含TCL内置命令和应用程序的相关命令。测试人员可以利用ATP语言编写测试用例,在此平台上完成对智能卡的自动化测试。该方案已经得到实际验证。
Traditional test platform for smarteard requires human intervention, seriously affects test proficiency. So, it has difficulty meeting the test needs in the smarteard industry. To solve this problem,a new method is developed and presented. Using the programming interfaces of PC/SC to communicate from test platform to smartcard. A new test language ATP, inclu- ding TCL built- in commands and application - specific commands, which is defined by extended TCL interpreter. Software testers may create test cases in ATP language to test smarteard almost completely automatic on the platform. The method has been verified in practice.
出处
《现代电子技术》
2010年第4期89-91,共3页
Modern Electronics Technique
