摘要
针对在计算机视觉技术对大豆叶面积的无损测量研究中,如何校正图像和去除植物叶片纹理特征等问题,提出了投影映射无损测量法。测量有效性不受叶片大小、形状差异和叶片图像中叶片周边白色背景的影响。实验验证结果表明,该方法利用较少的特征点对就能很好地校正叶片图像,解决了非线性校正问题,并且图像信息量损失小。
This paper advanced bilinear mapping non - loss measurement which aimed at problems of how to correct image and wipe off texture feature in study of non - loss measurement of soja - leaf area using the technology of computer vision. The validity of measurement has not been influenced by size, figure differentia and white background of leaf, the experiment shows that this method which sovles the problem of non - linear correction can be used to correct the lamina image with lesser feature points and lesser loss of information.
出处
《农机化研究》
北大核心
2010年第3期171-173,共3页
Journal of Agricultural Mechanization Research
基金
黑龙江农垦总局科技攻关项目(HNKXIV-09-01-02)
关键词
大豆
叶面积
无损测量
投影映射
soybean
leafarea
non - loss measurement
projection model