存储器测试算法的实现

Implementation of the Test Algorithms for Memory

存储器测试算法的选择以及测试的实现方法是存储器测试的关键。本文在对存储器的故障模型分析的基础上,对具有代表性的测试算法进行了深入的研究,并采用软件实现法将一些典型的测试图形在我所的BDS-9110测试论断系统上进行了实现,生成了存储器检测图形库。利用该图形库作者对980JX系统的存储器模块980/164进行了测试。在研究和实验的基础上,对O(N)类的跨步算法进行了优化。

The test of on - board memory is one important field of digital circuit test. Selections of algorithms and methods of implementation of memory test are the two popular research topics. This paper mainly discusses some representative function memory test algorithms.and describes the realization methods for memory test patterns in detail according to the demanding of memory - board test. Based on the research of realizing methods of memory text, the author has finally developed the whole software for memory test patterns. Test patterns came true on the BDS-9110 test system,and a test pattern library for memory test was finally made. Taking advantage of the library, the memory module(80/164)of the rugged computer system 980JX was successfully tested. Further,the march pattern, which is of order N,is improved and its ability of detect faults are proven to be raised.