期刊文献+

Determination of Ultra Trace Level of Uranium in Electronic Materials by Fluorescence Spectrometry

Determination of Ultra Trace Level of Uranium in Electronic Materials by Fluorescence Spectrometry
下载PDF
导出
出处 《Journal of Chemistry and Chemical Engineering》 2010年第2期61-62,共2页 化学与化工(英文版)
关键词 荧光光谱法 电子材料 痕量水 测定 超高纯度 氟化钠 ppb Determination, uranium, electronic materials, fluorescence spectrometry.
  • 相关文献

参考文献6

  • 1T.C. May, M.H. Woods, New physical mechanism for soft errors in dynamic memories, 16^th Annual Proceedings of 1978 International Reliability Physics Symposium.
  • 2N. Honma et al., Determination of uranium and thorium in LSI materials, Journal ofE.C.L NTT 29 (1980) 81-91.
  • 3K. Kudo et al., Determination of uranium and thorium in LSI materials by activation analysis, Journal of E.C.L NTT 30 (1981) 2093.
  • 4T. Kawashima, Determination of uranium in the VLSI associated materials by fluorescence spectrometry, Coy. Rec of the 1984 International Chemical Congress of Pacific Basin Societies (1984) 01H10.
  • 5T. Kawashima, Estimation of uranium in VLSI associated electronic materials, 26^th Proceedings of 1984 Semiconductor and Integrated circuit Symposium, 86-91.
  • 6H. Mitsumata, Y. Kita, Determination of trace uranium in epoxy resin for semiconductor devices by fluorescence spectrometry after anion exchange separation and thenoyltrifluoroacetone liquid-liquid extraction, Bunseki kagaku 54 (2005) 1101- 1105.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部