高纯三氧化二钛中微量硅的萃取分光光度测定

Extraction-Spectrophotometric Determination of Silicon in High Purity Titanium(Ⅲ) Oxide

为了测定三氧化二钛中的微量硅，对萃取——分光光度测定法的某些操作步骤进行了改进和检验。利用Ｈ２ＴｉＯ３沉淀可将母体钛分离，硅的回收率大于９０％。稳定硅钼兰的还原状态后，可使分析的精密度大为提高。对钛氧化物中１０μｇ／ｇ量级硅的测定结果表明。

Certain operation steps of the extraction-spectrophotometry for determining micro silicon in titanium(Ⅲ) oxide has been improved and tested. The bulk of titanium could be seperated as H 2TiO 3 and the recovery rate of silicon was more than 90%. The analytical precision has been dramatically improved by stabilizing the reductive state of silicomolybdate blue. The determination results showed that this method satisfied the analytical requirement for the 10 μg/g level of silicon in titanium oxide.