反射式太赫兹返波振荡器成像系统及其应用

TERAHERTZ WAVE REFLECTION IMAGING SYSTEM BASED ON BACKWARD WAVE OSCILLATOR AND ITS APPLICATION

实现了基于返波管源的太赫兹波反射式成像系统.这是一种新型的无损探伤成像方式.从样品表面或者基底反射回来的太赫兹波被焦热电探测器收集,最后经过计算机处理成像.频率为0.7THz的成像系统被用来对一系列样品进行无损检测,如硬币、徽章、模型飞机以及预埋了人工缺陷的工业样品.结果表明,很多工业材料相对于太赫兹波都是透明的,尤其是一些在航空航天技术中具有广泛应用价值的吸收微波的材料.

A terahertz （THz） wave reflection imaging system based on backward wave oscillator （BWO） was presented. It is a new approach to non-destructive testing. The intensity information of the terahertz wave after being reflected from the sample surface or substrate was collected by a pyroelectric detector, and then imaged by computer. A number of samples which had potential imaging applications were tested by using 0.7 THz radiation, including coins, badges, a model airplane and some industrial samples that contained pre-built defects. The experimental results reveal that THz radiation is highly transparent to many industrial materials, especially the ＂microwave-absorbing＂ material which is widely used in aero and space technologies.