期刊文献+

Anti-CAF印制电路板的加工工艺研究 被引量:8

Research on Anti-CAF PCB Manufacturing
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摘要 文章简单介绍了PCB中离子迁移发生的原理以及影响Anti-CAF印制电路板耐离子迁移能力的因素,着重讨论了PCB制程中内层线路质量、黑化、层压、钻孔、Desmear参数以及排板结构对Anti-CAF印制电路板耐离子迁移能力的影响,得出了最佳的工艺参数及最优的排板结构,并在此基础上对比研究了四家供应商耐CAF板料的耐离子迁移的能力,得出了耐CAF性能最佳的耐CAF板料,为公司选用耐CAF板料提供了参考。 This paper briefly describes the mechanism and influence factors of CAF (Conductive Anodic Filament) in PCB. The influence factors on Anti-CAF ability in PCB manufacturing process were discussed, such as: the inner line quality, black oxide treatment, lamination, drilling, desmear parameters, lay-up structure and so on. At the same time, Anti-CAF ability of four types of Anti-CAF materials from different suppliers was analyzed and compared. We can draw a conclusion that the Anti-CAF ability of PCB was closely related to the material itself.
作者 陈正清
出处 《印制电路信息》 2010年第3期50-54,共5页 Printed Circuit Information
关键词 Anti—CAF印制电路板 工艺参数 排板结构 耐CAF板料 Anti-CAF PCB process parameter Lay-up structure Anti-CAF material
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参考文献2

  • 1杨忠华.覆铜板与Anti-CAF[J].印制电路信息,2002(12):20-22. 被引量:3
  • 2伍宏奎.离子迁移多路自动测试系统的实践.第三界全国覆铜板技术、研讨会资料集[C].2002.

二级参考文献5

  • 1[1]Conductive Anodic Filament Growth in Printed Circuit Materiasl J.P.Mitchell and T.L.Welsher,Bell Laboratories
  • 2[2]Test Setup,Procedures and Patterns for Conductive Anodic Filament(CAF)and Electrochemical Migration(ECM)Testing,Bob Neves,Microtek Laboratories
  • 3[3]Conductive Anodic Filament Growth Failure,Tarun Amla,Isola Laminate Systems Corporation
  • 4[4]Electrochemical Migration Testing-Evaluating PCB Design,Manufacturing Process and Laminate Material Impacts on CAF Resistance,Karl Sauter,Sun Microsystems Inc.
  • 5[5]Conductive Anodic Filament Resistant FR-4Substrates,William Vamell,Polyclad Technologies

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同被引文献25

引证文献8

二级引证文献13

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