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High contrast ratio,high uniformity multiple quantum well spatial light modulators

High contrast ratio,high uniformity multiple quantum well spatial light modulators
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摘要 Our latest research results on GaAs-A1GaAs multiple quantum well spatial light modulators are presented. The thickness uniformity of the epitaxial layers across the 3-inch wafer grown by our molecular beam epitaxy is better than 0.1% and the variation of cavity resonance wavelength within the wafer is only 0.9 nm. A contrast ratio (CR) of 102 by varying bias voltage from 0 to 6.7 V is achieved after fine tuning the cavity by etching an adjust layer. Both theoretical and experimental results demonstrate that incorporating an adjust layer is an effective tuning method for obtaining high CR. Our latest research results on GaAs-A1GaAs multiple quantum well spatial light modulators are presented. The thickness uniformity of the epitaxial layers across the 3-inch wafer grown by our molecular beam epitaxy is better than 0.1% and the variation of cavity resonance wavelength within the wafer is only 0.9 nm. A contrast ratio (CR) of 102 by varying bias voltage from 0 to 6.7 V is achieved after fine tuning the cavity by etching an adjust layer. Both theoretical and experimental results demonstrate that incorporating an adjust layer is an effective tuning method for obtaining high CR.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第3期62-65,共4页 半导体学报(英文版)
基金 supported by the President Fund of CAS,the International Collaboration Plan for Science and Technology of the Chinese Ministry of Science and Technology(No.2008KR0415) the Suzhou International Cooperation Fund,China(No.SWH0809).
关键词 spatial light modulator multiple quantum well UNIFORMITY contrast ratio adjust layer matching condition spatial light modulator multiple quantum well uniformity contrast ratio adjust layer matching condition
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