传声器管可靠性分析

Analysis on Reliability of FET

说明了半导体产品稳定性和可靠性的重要性,它是生产和应用中关注的技术指标。即便是同类型产品,因结构设计不同,执行的标准及考核手段也不完全一样。分析了传声器管失效的原因,大多是因其PN结特性变坏或PN结受损造成。指出了对传声器管进行静电放电试验会对P+N结构成一定的损伤。

As is known to all,the stability and reliability of the semiconductor products stand for its quality level and prestige.These are also the key characteristiec for production and application.Because the difference of structure design, especially tile executive standards and the check means.Even the same kind products are absolutely differenLThe effectiveness losing of FET, almost because its PN junction＇s characteristic has variance and demage.So the PN junetion＇s demage are divided into pyroelectric breakdown and partial breakdown.The former is owing to the limit of the design,but the latter belong to PN junction＇s internal defect.