摘要
针对NANDFlash在存储数据时对可靠性的要求,分析传统坏块管理方式的弊端,提出一种基于现场可编程门阵列(FPGA)的坏块处理方案,采用在FPGA内部建立屏蔽坏块函数的方法屏蔽坏块。该方法彻底屏蔽对坏块的操作,可以实现对Flash的可靠存储。实际工程应用证明其具有较高的可靠性。
Aiming at the request of stability of data storage about NAND Flash, this paper analyzes the disadvantages of traditional handle scheme and proposes a handle scheme to deal with bad block based on Field-Programmable Gate Array(FPGA). It constructs bad block shield function in FPGA to shield the bad block. This method thoroughly eliminates the influence on other operation caused by bad block. By using this method, data can be successfully stored in flash and it ensures the correctness of data. This method is carried out in a project with high stability.
出处
《计算机工程》
CAS
CSCD
北大核心
2010年第6期239-240,243,共3页
Computer Engineering
关键词
闪存
现场可编程门阵列
坏块
Flash
Field-Programmable Gate Array(FPGA)
bad block