Ag层厚度对Ag/Fe/Ag薄膜的微结构和磁特性的影响

Effect of Ag Layer Thickness on Microstructure and Magnetic Properties of Ag/Fe/Ag Thin Films

室温下,利用直流对靶磁控溅射设备制备了Ag(x)/Fe(35nm)/Ag(x)系列薄膜,x=1,2,3,4nm.利用扫描探针显微镜(SPM)观测了样品的表面形貌及磁畴结构,应用X射线衍射仪(XRD)分析了样品的晶体结构,通过振动样品磁强计(VSM)测量了样品的磁特性.研究表明,非磁性Ag层厚度对Ag/Fe/Ag系列薄膜的微结构和磁特性有很大的影响.SPM观测显示,随Ag层厚度增加磁畴尺寸呈现先减小后增加的趋势.VSM结果显示,矫顽力的变化与磁畴尺寸的变化趋势是一致的,x=3nm时,垂直膜面矫顽力达到最大.

Ag（x ）/Fe（35 nm）/Ag（x ） thin films were prepared by DC facing-target magnetron sputtering at room temperature, the thickness of Ag layer x = 1,2,3,4,5 nm. The morphologies and magnetic domain structures were observed by scanning probe microscope （SPM）, the crystal structures were analyzed by X-ray diffraction （XRD）, the magnetic properties were measured by vibrating sample magnetometer （VSM）. It has been found that the microstructure and magnetic properties of Ag/Fe/Ag films depend strongly on the thickness of Ag nonmagnetic layer. SPM shows the size of magnetic domain decreases and then increases with increasing Ag layer thickness. The VSM shows that the change of coercivity consistents with the change of magnetic domain size. The perpendicular coercivities reach maximuna value as the thickness of Ag layer was 3 nm.