摘要
电子衍射实验表明,当单体酞菁硅二醇Si(Pc)(OH)2在NaCl单晶(100)解理面上气相沉积时,所得的聚酞菁硅氧烷[Si(Pc)O]n薄膜晶体中的分子链轴相对于膜面的取向,随衬底温度的升高而发生有规律的变化:不确定(150℃)→平行→平等+垂直→垂直(350℃)。高分辨电子显微像显示,与其在固态聚合时的情形不同,气相沉积时所得的[Si(Pc)O]n微晶主要属于四方晶系,只有少量属于带心的正交晶系。上述平行或垂直。
Electron diffraction results indicated that the orientation of the molecular chain axis in the resulting poly(phthalocyaminatosiloxane),n,film crystal while its monomer,Si(Pc)(OH) 2,vapour was depositing on a newly cleaved (100) plane of NaCl single crystal changed regularly with the substrate temperature increasing as follows:indefinite (~150℃)→parallel(295℃)→parallel+perpendicular→perpendicular(≥350℃).High resolution electron micrographs showed that the crystal system of the most of the resulting n micro crystals from vapour deposition is tetragonal one which is different from that resulting from solid stste polymerization,only a little is centred orthogonal one.Above mentioned tetragonal or orthogonal,parallel or perpendicular crystallizing behaviour is possibly related to induced crystallization by superlattice of the substrate.
出处
《电子显微学报》
CAS
CSCD
1998年第6期734-738,共5页
Journal of Chinese Electron Microscopy Society
关键词
聚酞菁硅氧烷
导电聚合物
外延生长
晶体
poly(phthalocyaninatosiloxane)\ conductive polymer\ molecular image\ high resolution electron microscopy (HREM)\ epitaxially growing crystals