摘要
介绍一种晶体管参数测量平台的方案,给出硬件组成和软件流程。使用ARM处理器及WinCE系统作为软硬件基础,以S3C2410为核心控制电路,利用12位D/A模块TLV5618产生稳定的控制电压、10位A/D模块TLC1543完成电压测量。将晶体管参数测量平台与单片机及传统示波器测量平台做了比较,其测量精度高于示波器,并且在对数据的分析处理能力及速度上ARM优于单片机,结果表明该系统性能可靠、速度快、精度高且便携。
The program of transistor parameter measurement platform is introduced, the hardware components and soft- ware process are given. Using ARM processor and WinCE system as the basic hardware and software,S3C2410 as the core control circuit, using 12 bit D/A module TI.V5618 produce a stable control voltage, 10 bit A / D voltage measurement module TLC1543 complete voltage measurement. Transistor parameter measurement platform and the traditional single chip platform, oscilloscope measurements platform are compared, the measurement platform is more accurate than the oscilloscope platform, and ARM is better than single chip microcomputer in data processing. Results show that the system is reliable,fast speed,high accuracy and portability.
出处
《现代电子技术》
2010年第6期40-42,共3页
Modern Electronics Technique
