基于过采样技术提高ADC分辨率探析

Improving the Resolution of ADC Based on Over-sampling

近年来,许多系统都需要使用模/数转换器ADC进行测量,将模拟信号转换为数字信号。为了简化系统电路和降低生产成本,在充分利用ADC采样速度的条件下,通过过采样技术提高ADC的分辨率。这里基于ADC的基本结构,采用叠加成形函数的方法,介绍了用过采样的方法来达到较高分辨率和信噪比,得出采样技术可以在不使用昂贵的ADC芯片的情况下提高模/数转换的分辨率。

In recent years, many systems need to use ADC to survey, transforming stimulant signal to figure signal. In order to simplify the circuit of system and reduce the cost, over - sampling technique is applied to increase ADC＇s resolution while making full use of the speed of ADC. Based on the basic structure of ADC, adopting addition of the shaped function introducing achieve upper resolution and SNR by over -sampling,and have the conclusion：over- sampling technique can improve the resolution of ADC in the satiation of not use expensive CMOS chip.