CCD辐射测温的数值解析及误差校正

Numerical Analysis and Error Correction of CCD Radiation Thermometry

提出一种新的CCD辐射测温数值校正方法。针对CCD测温时的两个主要误差来源(CCD光谱响应曲线和辐射体光谱发射率)进行了分析,运用图象处理技术对CCD光谱响应曲线进行离散化数值解析,借助比色测温原理标定并解析辐射体光谱发射率,建立了CCD辐射测温校正公式,实验数据表明测温方法及误差校正的有效性。这种测温方法是由CCD图像传感器对辐射体直接采集成像,在工业现场可摈弃附加外设的繁琐和不便,为辐射测温系统的便携性、实用化创造了条件。

This paper presents a new numerical CCD radiation temperature correction method.The method analyzed two main error sources（CCD spectral response curve and spectral emissivity radiator）of CCD radiation temperature,used image processing technology to discrete and numerically to analyse the CCD spectral response curves,and established the CCD radiation temperature correction formula with the aid of the principle of color temperature calibration to analysis of Spectral Emissivity of radiator.The experimental data showed the effectiveness of error correction of the temperature measurement method.This measurement method directly acquires the image of the radiator by the CCD image sensor.It can get rid of additional peripherals in the industrial site,make the radiation temperature measuring system practical and portable.