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Effects of switching pulse width and stress on properties of Bi_(3.25)La_(0.75)Ti_3O_(12) thin films

Effects of switching pulse width and stress on properties of Bi_(3.25)La_(0.75)Ti_3O_(12) thin films
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摘要 Polycrystalline ferroelectric Bi3.25La0.75Ti3O12 thin films are prepared on Pt/Ti/SiO2/Si substrates by the conventional metalorganic decomposition method. It is observed that with the increase of switching pulse width, the remnant polarisation and the coercive field increase. A wider switching pulse can result in poorer fatigue properties, which comes from more charged defects diffusing to and being trapped on domain walls. On the other hand, when the compressive stress is applied to films, the fatigue properties can be improved. This phenomenon is due to the reorientation of domains under stress. Polycrystalline ferroelectric Bi3.25La0.75Ti3O12 thin films are prepared on Pt/Ti/SiO2/Si substrates by the conventional metalorganic decomposition method. It is observed that with the increase of switching pulse width, the remnant polarisation and the coercive field increase. A wider switching pulse can result in poorer fatigue properties, which comes from more charged defects diffusing to and being trapped on domain walls. On the other hand, when the compressive stress is applied to films, the fatigue properties can be improved. This phenomenon is due to the reorientation of domains under stress.
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2010年第3期412-415,共4页 中国物理B(英文版)
基金 Project supported by the National Natural Science Foundation of China (Grant No. 50871029) the National Basic Research Program of China (Grant Nos. 2010CB923401 and 2009CB929501) the Cyanine-Project Foundation of Jiangsu Province of China (Grant No. 1107020060)
关键词 ferroelectric films polarisation DOMAINS ferroelectric films, polarisation, domains
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