摘要
本文概述了电子显微技术在纳米材料研究中的应用特点和适用范围,介绍了透射电镜(TEM)、扫描电镜(SEM)、扫描隧道显微镜(STM)和原子力显微镜(AFM)等电子显微技术在纳米材料中的新应用和新方法。
The application features and scopes of the electron microscope to study the nano-material are reviewed in this paper.The new applications and methods about transmission electron microscope(TEM),scanning electron microscope(SEM),sannning tunneling microscope(STM),and atomic force microscope(AFM) technologies are introduced.
出处
《矿冶》
CAS
2010年第1期53-56,共4页
Mining And Metallurgy
基金
辽宁省抚顺市科技局项目(20091203)