摘要
以杏树１年生枝条为材料，对４０个杏品种进行了抗寒性研究。结果表明，电导法测定杏抗寒性结果稳定、可靠。以－２４～－４０℃处理的电解质渗出率，配以Ｌｏｇｉｓｔｉｃ方程、多数品种具有较好的拟合度，方程代表的“Ｓ”型曲线拐点可以看作是杏休眠枝的临界致死温度，对４０个样本用恢复生长法验证与ＬＴ５０结果基本一致。
The hardiness of apricots was assayed with 1 year old dormant shoots of 40 varieties or species.The researches showed that the hardiness evaluated with electronic conductivity method was constant and reliable.Electrolyte leakage of -24～-40℃ treated shoots corresponded well with Logistic equation for most cutivars and species.It is suggested that the turning point in the equation may be considered as critical lethal temperatures(LT 50 ).This corresponded well with the regrowth test of 40 warieties.
关键词
杏
抗寒性
电导率
半致死温度
LOGISTIC方程
apricot
hardness
electro lyte leakage
lethal dose 50 temperature
Logistic equation
