萃取色层分离ICP/MS测定U_3O_8中痕量杂质元素

Determination of Trace Impurity Elements in U_3O_8 by ICP/MS with Levextrel Resin Chromatography

本文叙述了结合CL－TBP萃取色层分离，运用ICP／MS测定U3O8中痕量杂质元素B、Ti、Cd、V、Cr、Zn、Mo、Sb、W、Bi的方法。U3O8经硝酸溶解后，采用CL－TBP草林树脂作固定相，5．5mol／L，硝酸作流动相的萃取色层法使杂质元素与铀基体分离，杂质元素淋洗液用ICP／MS测定。取样量为O．5g时，各杂质元素的测定下限为1×10（-8）g／g。方法的重加回收率在88％－116％之间，相对标准偏差小于14％。

A method for the determination of B,Ti,Cd,V,Cr, Zn, Mo,Sb,W and Bi in U3O8 by ICP/MS with TBP Chromatography is reported. The sample is dissolved in the solution of HNO3 and the uranium is separated by TBP levextrel resin chromatography. The trace elements retained in the aqueous phase are detected by ICP/MS. With a sample of 500mg, the detection limlts for all above elements reach down to 0. 0l X 10(-6)g/g, the average rccoveries are about 88~116% and the relative standard devlatlon is less than 14%.