运算放大器SET效应的试验研究

Experimental Research on SET Effects of Operational Amplifier

模拟器件的单粒子瞬态脉冲效应的研究,成为近来国际上单粒子效应研究的热点.针对中国生产的运算放大器SF3503,利用脉冲激光单粒子效应测试装置,试验研究了SF3503工作于反相放大器与电压比较器模式SET效应的特征与规律.获取了器件的敏感节点分布、LET阈值和SET脉冲波形的特征参数,其中器件的敏感节点均分布在输入级与放大级,LET阈值不大于1.2 MeV·cm~·mg^(-1),电压比较器产生的最大SET脉冲的幅度达27V、脉冲宽度为51μs.试验表明SF3503对SET效应极其敏感,在不采取任何措施的情况下,在空间任务中直接使用,会严重影响系统的可靠性.

In recent years,the Single Event Transient（SET） has gradually come into focus in the field of Single Event Effect（SEE） research.The SET effects of operational amplifier SF3503,which is designed in the applications of inverting amplifier and voltage comparator,have been investigated by pulsed laser test facility.The equivalent Linear Energy Transfer（LET） has been calculated with the pulsed laser and device parameters,including pulsed laser wavelength,energy and dielectric depth in device.The identification of sensitive nodes,LET threshold and SET pulse shape characteristics has been tested.While all the sensitive nodes are included in the input stage and amplified stage, LET threshold is no more than 1.2MeV·cm^2·mg^（-1）,the amplitude of 27 V and duration of 51μs have been achieved in the voltage comparator.Positive,negative and dual polar pulses were observed in the experiment.The transistor Q_（16） of amplified stage has been examined as the most susceptible node in the circuit.For the vulnerable SET effects of the SF3503,the device is not qualified for application in the space mission directly.