CMOS电路电流测试技术研究

A Survey of Current Testing for Cmos Circuits

集成电路的设计与测试是当代计算机技术研究的主要问题之一。CMOS集成电路测试技术,受到人们的广泛关注。本文介绍了CMOS集成电路测试技术基本原理和关键问题,探讨了电流测试的研究进展及现状,并提出了该技术的研究方向。

IC design and test is one of the major research areas in computer technology today.Testing technology of CMOS IC was widespread concerned by the people.This paper introduces CMOS IC test with the fundamental principles and key issues,discusses the current test research development and the present situation,and proposes this technical research direction.