电容提取的新摄动方程及小波边界元解法

Improved Perturbation Approach and Fast Wavelet Galerkin BEM for Capacitance Extraction

提出一种解决含高电容率介质结构电容提取问题的新摄动方程,使计算时间减少一半.建立新摄动方程的快速小波Galerkin边界元解法.算例证明新摄动方程精度高且受介质电容率影响小;用小波Galerkin边界元求解的效率高,时间和内存消耗达到最优O(N)(N为未知量数目).

We describe an improved perturbation approach for electrostatic analysis of three-dimensional structures consisting of dielectrics with high-permittivity ratios. Unlike original perturbation approach, the new approach uses only one system matrix with different right hand sides. A fast wavelet Galerkin boundary element method （WGBEM） is used to solve integral equations. Compared with wavelets defined in parameter spaces in a conventional WGBEM, the wavelets here are directly constructed on usual boundary element triangulation. It enables the proposed WGBEM to solve electrostatic problems in complicated geometries, unstructured meshes and comparatively coarse discretizations. Numerical results show that the improved perturbation approach combined with WGBEM has high accuracy and almost linear computational complexity.