用X射线衍射仪法测定纯铜点阵常数

Application of X Ray Diffractometer Method Determines the Lattice Constant of Pure Cu

用Ｘ射线衍射仪法对光谱纯铜进行了点阵常数的精确测定，给出了测定值．从实验技术方面进行了分析阐述，为金属材料研究和大学近代物理实验选题提供了参考．

In this paper,we apply X ray diffractometer method to determine the crystal space lattice constant of spectrum pure metallic copper Cu accurately.This paper expounds items of experiment technology.