航天器内部充电效应及典型事例分析

Analysis of a typical internal charging induced spacecraft anomaly

航天器内部充电效应是由空间高能电子诱发的,通常发生在航天器内部以及表面绝缘材料深层,所产生的放电击穿及静电放电脉冲干扰较表面充电更为严重.对内部充放电的一般规律进行了总结,并就一次典型的航天器异常事件,从异常的时空表现特征及其与高能电子环境扰动的相关性角度进行了深入分析和定量计算,得出了高能电子产生的内部充电引起的卫星异常的结论,为卫星异常诊断提供了范例.

Internal charging is generated by penetrative electrons from the outer radiation belt,and the resultant discharges usually occur inside spacecrafts or sdeeply in the surface dielectrics.Therefore it may produce more serious results in electronics on board compared with surface charging.In this article,the general characteristics of internal charging were introduced,and,as an example,an internal charging induced anomaly,which took place on Double Star（TC-1 and TC-2） was analyzed through correlation of the anomaly with high energetic electron enhancement.The analysis provides a typical instance for spacecraft anomaly diagnostics.