波导测量中介电参量与试样厚度关系的规律性

REGULARITY OF THE RELATION BETWEEN DIELECTRIC PARAMETER AND SPECIMEN THICKNESS IN WAVEGUIDE MEASUREMENT

利用波导测量系统，在稳频、稳幅及电路匹配的条件下，对介电参数进行测量。在短路、开路的情况下，得到了反映系数的振幅Γ与试样厚度d／λω的关系。通过误差分析，找出了准确测量介质材料时试样的厚度。

Under conditions of stablized frequercy,amplitude and circuit matching, the dielectric parameters are measured by the system of waveguide measurement in the case of opencircuit and shortcircuit. The relation between amplitude of reflect coeffcient |Γ| and specimen thickness d/λεis given. By means of error analysis,the specimen thickness is found out for accurately measuring dielectric parameters.