回溯法在多孔材料孔径测量中的应用

Pore Size Measurements of Porous Media with Backtracking

为了研究多孔材料的微观特性,必须对其微观结构进行测量。首先分析并指出了迭代法、递归法在多孔材料微结构孔洞标记中的不足之处,然后结合回溯法的思想采用一种新的多孔材料孔洞标记法,并利用迷宫问题具体分析了标记的过程。最后用VC++编程实现了淀粉扫描电子显微镜(scanning electron micro-scope,SEM)图像和陶瓷SEM图像的孔径测量(包括孔洞标记、孔径面积)。实验结果表明,该方法改善了前两种算法的不足,实际运行效果良好,具有较好的实用价值。

To study micro-scale characteristics of porous media,the micro-scale structure has to be measured.Due to limitations of iterative method and recursive method,backtracking algorithm was used to mark the pore areas.The marking process was analyzed by labyrinth.VC ＋ ＋ programming was adopted to measure pore size of starch SEM（scanning electron microscope） image and TiB2 SEM image.The measurement included pore-marking and the pore area calculating.The results showed that backtracking algorithm improved the former two methods and had good application value.