摘要
采用辉光放电质谱(GD-MS)对碲、镉原材料中锂、硼、钠、铝、硅、铁、铜、锌、镓、砷、银、金、铅、铀等62个杂质元素进行了测试,并与激光烧蚀电感耦合等离子体质谱(LA-ICP-MS)所测的结果进行比较,对结果差异的潜在因素、个别元素含量异常偏大的原因进行了系统分析,着重论述VG9000辉光放电质谱仪的特点及痕量杂质分析优势。
One purity tellurium and one purity cadmium were analyzed by glow discharge mass spectrometry (GD-MS). Each sample was prepared accordingly and subsequently analyzed for a wide range of 62 elements. The results have been compared with those were analyzed by laser ablation inductive coupled plasma mass spectrometry (LA-ICP-MS). Characteristics and advantages of analyzing trace impurity of VG9000 instrument are discussed.
出处
《红外技术》
CSCD
北大核心
2010年第4期226-230,共5页
Infrared Technology