RDX/HMX炸药晶体内部缺陷表征与冲击波感度研究

Intragranular Defects and Shock Sensitivity of RDX/HMX

采用折光匹配显微观察(OMS)和原子力显微镜(AFM)表征、X射线小角散射(SAXS)、表观密度浮沉法(SFM)、微聚焦CT扫描等方法,研究了不同结晶品质RDX、HMX晶体缺陷。OMS观察结果表明,普通RDX/HMX较降感RDX/降感HMX(RS-RDX/RS-HMX)晶体含有更多的表面裂纹与内部孔洞;X射线小角散射与高精度CT扫描统计测试结果表明,RS-RDX/RS-HMX晶体内部也含有一定数量较小尺寸的缺陷,但较普通RDX/HMX晶体内部含较大尺寸缺陷数量少。冲击波感度实验结果表明,炸药晶体缺陷数量、尺寸对PBX冲击波感度有较大影响。

The crystal internal defects of RDX/HMX were studied by optical microscopy with matching refractive（OMS）,small angle scattering of X-ray（SASX）,atomic force microscope（AFM）,sink-fload method（SFM）and Mirco-CT.OMS and AFM results show that RDX/HMX has more defects and cracks than reduced sensitivity-RDX/reduced sensitivity-HMX.SASX results show that crystal internal defects of RDX/HMX are larger than that of RS-RDX/RS-HMX,and mirco-CT results show that RDX has larger internal defects than RS-RDX.Furthermore,shock sensitivity of RDX based PBXs and RS-RDX based PBXs were studied,and the results show that internal defects of RDX has great influence on shock sensitivity of RDX.