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纳米丝应变率和尺寸效应的数值模拟 被引量:1

Simulation of the Strain Rate Effcet and Size Effect for Nanowires
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摘要 在绝对零度下,利用基于分析型嵌入原子势的分子动力学模拟了体心立方(BCC)结构的纳米丝在不同应变率、和不同截面尺寸下的的拉伸变形过程,结果表明:在拉伸过程中,纳米丝表面出现了滑移带,并沿<010>方向发生脆性断裂;不同应变率只影响试样的断裂强度,应变率越大,断裂强度越高;而截面尺寸越大,屈服强度降低,断裂强度和弹性模量增大. The strain rate effect and size effect of nanowireS were studied by molecular dynamics simulation, it's based on the embedded atomic potential. The results showed: during the stretching agenda ,Shear band was observed and the brittle fracture was taken place along 〈010〉 direction. The strain rate only effected the fracture strength, with the increase of strain rate ,the fracture strength increased accordingly. As the cross section size increased,the yield strength will decrease ,the Young's modulus and fracture strength will increase correspondingly.
出处 《西南师范大学学报(自然科学版)》 CAS CSCD 北大核心 2010年第2期27-31,共5页 Journal of Southwest China Normal University(Natural Science Edition)
关键词 纳米丝 脆性断裂 屈服强度 断裂强度 nanowires brittle fracture yield strength fracture strength
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  • 1郭仪,白春礼.扫描隧道显微镜针尖制备及其影响因素的研究[J].真空科学与技术,1993,13(1):56-64. 被引量:9
  • 2王明环,朱荻,徐惠宇.电化学腐蚀法制备针尖的试验研究[J].传感器技术,2005,24(3):24-26. 被引量:12
  • 3谷坤明,汤皎宁,张潇,刘慧君.液膜法制备STM探针研究[J].广东化工,2007,34(7):33-36. 被引量:6
  • 4MULLER A D, MULLER F, HIETSCHOLD M, et al. Characterization of Electrochemically Etched Tungsten Tips for Scanning Tunneling Microscopy [J]. Rev Sci Instrum, 1999(70): 3970-3972.
  • 5SCHMIDT U, RASCH H, FRIES T, et al. Characterization of STM W Tips by FIM with an Organic Image Gas[J]. Surf Sci, 1992, 266: 249-252.
  • 6SONG J P, PRYDS N H. A Development in the Preparation of Sharp Scanning Tunneling Microseopy Tips. Rev Sci Instrum, 1993, 64 (4) : 900- 903.
  • 7IBE J P, BEY P P, B RANDOW JR S L, et al. On the Electrochemical Etching of Tips for Scanning Tunneling Micros copy [J]. Journal of Vacuum Science & Technology A: Vacuum, Surface and Films, 1990, A8(4):3570-3572.
  • 8VASILE M J, GRIGG D A, GRIFFITH J E, et al. Scanning Probe Tips Formed by Focused Ion Beams I-J]. Rev Sci Instrum, 1991, 62(9): 2167-2171.
  • 9PASQUINI A, PICOTTO G B, PISANI M. STM Carbon Nanotube Tips Fabrication for Critical Dimension Measurements [J]. Sens Actuators Aphys, 2005, 123-124: 655-659.
  • 10吴雪梅,杨礼富,甘俊彦,王梦玉,鞠艳.扫描隧道显微镜针尖的电化学腐蚀制备方法[J].苏州大学学报(自然科学版),1997,13(3):47-50. 被引量:14

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