用步进激励、步进采样的方法测试集成运算放大器的参数

The Paraement of IC Wased Tested Method by Using Step-by-step Excitation,Step-by-step Sample

集成运算放大器是一种通用性很强的功能部件。它在自动控制系统、测量仪表及其它电子设备中得到越来越广泛的应用。因此,就要对集成运算放大器的参数进行快速、准确的测试。本文用步激励、步进采样和最小二乘法的统计测试原理对集成运算放大器参数进行估测,在硬件设计的基础上,进行系统的软件调试。对一些主要的子程序框图进行了详细的说明。系统具有自动零点校准和偏位法补偿的功能,系统在软件程序控制下,进行自动测试,系统测试所运用的原理目前在国内是较新的。

IC is a powerful function parts of appling universally. It is more and more extensive application in the automatic control system and testing instrument and electron equitmcnt. Therefore. IC parpcment were quikly and accurately tested. This paper estimated paracmeters of IC amplifiers of stcp-by-stcp excitation.step-by-step sample.least squares. Based on the designing of hardware, software of system was debugged. These main programer frames arc instruduccd in detail. The function of zera adjustment and deviation compensation can be realized in the system. Under the system programmers controlling.the system can autmat-ic measured. The principle of measuring system was completely newly in our country.