摘要
回顾了原子荧光的发展,并综述了原子荧光在中国电子电气产品中重金属元素检测领域的进展:主要是开发了原子荧光测Cr(VI)的方法和仪器,及对现有测Pb、Cd的方法进行改进,以解决电子电气产品中高金属基体对测量的干扰。最后,展望了原子荧光在中国电子电气检测领域中的应用前景。
The advance of atomic fluorescence spectrometry （AFS） and the application of AFS for determination of heavy metals in China RollS were reviewed. Two problems in this application were overcome： one was the development of analysis method and AFS instrument for Cr（VI）; the other was the improvement of analysis method for Pb and Cd by AFS to eliminate the matrix interference caused by high concentration metal elements. Moreover, the prospects for application of AFS in China RollS were described.
出处
《信息技术与标准化》
2010年第5期11-13,16,共4页
Information Technology & Standardization
关键词
原子荧光
ROHS
CR(VI)
电子电气产品
重金属检测
Atomic Fluorescence Spectrometry
Restric of Harzardous Substance
Cr（VI）
electrical and electronic products
determination of heavy metals
