基于FAN算法的串扰时延故障的测试矢量生成

Test Pattern Generation for Crosstalk-induced Delay Faults Based on FAN Algorithm

串扰噪声已成为在深亚米工艺下造成电路功能错误的一个主要原因,对串扰时延测试已成为一个迫切的问题。利用FAN算法完成串扰时延故障的测试矢量生成,并且利用其多路回退和回溯等主要特色,来提高测试生成算法的效率。

With deep submicron technology,crosstalk noise becomes the major cause of mistakes on circuit function.It is a pressing issue on testing of crosstalk-induced delay faults.This paper uses the FAN algorithm to finish the test pattern generation for crosstalk-induced delay faults.By using backtrace and backtrack of FAN algorithm,the efficiency of test generation algorithm has be improved.