嵌入式SRAM测试算法及其诊断实现

Test Algorithm and Diagnosis Implementation for Embedded SRAM

为有效定位和识别嵌入式静态随机访问存储器(SRAM)中的各种故障,改进SRAM的设计和生产流程,提出一种有效的March19N(N表示存储器的深度)测试算法.把故障注入64×8位的SRAM;再将测试算法的读/写操作转化为控制器的控制状态,并设计带诊断支持功能的内建自测试(BIST)模块;最后用该BIST模块测试注入的故障,并对测试数据进行比较与合成,从而实现故障的测试和定位.通过对仿真实验结果的分析,得出了包括固定型故障、开路故障、跳变故障、跳变耦合故障、幂等耦合故障、状态耦合故障和地址译码故障在内的故障字典表;并由此得出各类故障所具有的不同的故障识别标志,表明文中算法具有较高的故障分辨率.

This paper proposes an effective March 19N（N represents the address number of memory） test algorithm for an effectively detecting fault locations and identifying variety fault types which produces in the embedded static random access memory（SRAM）,consequently improving the design and manufacture process of SRAM.Firstly,faults injection into a 64 × 8-bit SRAM;Secondly,read and write operations of the algorithm are translated into the states of controller,and then design a built-in self-test（BIST） with diagnostic support module;Finally,using the BIST module test the injection faults,then comparing and synthesizing the test data,in order to achieve faults testing and location.When analyzing simulation results,a fault dictionary is constructed for stuck-at fault,stuck-open fault,transition fault,inversion coupling fault,idempotent coupling fault,state coupling fault and address decoder fault.The fault dictionary shows that faults have different fault signature,similarly,it also shows that the algorithm has a completely diagnostic ratio.