摘要
随着计算机、集成电路等技术的飞速发展,红外图像处理无论在算法、结构上,还是在应用以及普及程度上都取得了长足的进展。本文在深入分析各种数字图像处理方法的基础上,采用了一种新的中值算法对传统红外图像处理方法进行了改进,有效地改善了数据的处理结果并明显降低了系统逻辑资源的占用。此外,还通过FPGA板卡对本算法其进行验证。实验结果表明,本系统设计的算法能够很好地完成大容量数据流的实时处理,达到了预期的设计目标。
With the rapid development of the computer and integrated circuits,Infrared image processing has made considerable progress on not only algorithm-structure but also application.The Measurement System of multiple element detector chip be used to test and screen the chips of Infrared detector.The equipment mostly check up background currents,leakage-current,dynamic impedance and C-V characteristic etc of the chips,meet the requirements of multiple element detector.On the development and manufacture of diverse infrared focal-plane array (IRFPA),it is an essential device.In this paper we devise a Measurement System of multiple element detector base on the Agilent VEE environment.The experiment results prove this system have preferable accuracy of measurement, achieved all that expected.
出处
《电子测试》
2010年第5期49-54,共6页
Electronic Test
关键词
红外图像处理
FPGA
测量系统
infrared image processing
FPGA
measurement sustem