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SiO_2二次纳米粒子热处理后微结构变化的TEM观察

TEM Observation of Microstructural Changes on the Silica Secondary Particles after Heated-treatment
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摘要 本文通过透射电子显微镜(TEM)观察到由空气-水界面上生成的SiO2二次纳米粒子煅烧后所发生的微结构变化,探讨了变化机理。结果表明:SiO2二次粒子中一次粒子的直径在400℃煅烧后从外向里呈现递减变化;外层粒子受热长大形成堆积孔,导致内部较小的一次粒子通过堆积孔的空隙在超声震荡下散逸出来。 TEM was successfully applied to observe the microstructural changes of air-water interfacial SiO2 secondary particles and the transformation mechanism were investigated in this paper. The results indicated that the size of primary particle in the secondary particle showed gradient variations from the inside to out after heated at 400 ℃, the outside primary particles were converted into the piled-pore structure at high temperature. Thus the inside primary particles with smaller size could diffuse into solution through the piled-pores under ultrasonic treatment .
出处 《硅酸盐通报》 CAS CSCD 北大核心 2010年第2期454-457,共4页 Bulletin of the Chinese Ceramic Society
基金 国家自然科学基金项目(No.50772048)
关键词 SiO2二次粒子 热处理 梯度变化 silica secondary particles heated-treatment gradient variations
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参考文献10

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