摘要
相位噪声和杂散性能是制约直接数字频率合成器（ＤＤＳ）用于高稳定频率源的关键指标。文中给出了一种全新思维，定量分析了ＤＤＳ中由相位截断引起的杂散谱及由相位截断、ＲＯＭ存储器有限字长和ＤＡＣ性能对其相位噪声性能的影响。
Phase noise and spurious spectrum are the key characters in direct digital synthesizers (DDS)applied in the high stable frequency source. Actually, the poor performance of spurious spectrum from DDS hasalways restrained its applications. This paper introduces a new way to analyze the spurious spectrum and phasenoise generated by the phase truncation. The locations and amplitudes of spurious spectrum are preciselydtermined. Phase noise generated by the size of ROM look-up table and the performance of DAC is alsoinvestigated.
出处
《电子科技大学学报》
EI
CAS
CSCD
北大核心
1999年第1期24-27,共4页
Journal of University of Electronic Science and Technology of China
基金
国家"九五"重点科研项目
关键词
直接
数字频率合成器
相位截断
相位噪声
direct digital synthesizers
phase truncation
spurious spectrum
phase noise
