摘要
尘土污染是造成手机机电元件电接触故障的主要原因之一。尘土进入手机是影响手机可靠性的前提条件,对于手机类接口较小的设备,尘土并不容易直接进入,振动和接口尺寸结构是影响此类设备尘土进入的主要因素。主要研究了尘土量与振动的关系,通过振动试验得到尘土的进入量随时间的增加先上升后下降,即尘土的进入量随着时间的增加先增多后减少,进而对结果进行多元非线性回归拟合,得出手机接口内部尘土量与振动的关系可以用二元高斯函数来表征的结论。
Dust pollution is one of the main reasons that caused the electrical contact failure of cell phone electromechanical components.The dust particles that enter into cell phones can affect their reliability.For devices with small interfaces such as cell phones,it is actually not easy for dust particles to enter directly.Vibration and the structures of interfaces are the two main factors that affect the entrance of dust particles into such equipment.In this paper,the relationship between vibration and dust entrance is studied by vibration tests.It is shown that the amount of entered dust increases at first and then decreases.Through multiple nonlinear regression analysis of the results,it is concluded that the relationship between the amount of dust particles in the interface of the cell phones and the vibration can be expressed using the binary Gaussian function.
出处
《电子产品可靠性与环境试验》
2010年第2期32-35,共4页
Electronic Product Reliability and Environmental Testing
关键词
尘土污染
尘土进入
振动
非线性回归
高斯拟合
dust pollution
dust entrance
vibration
nonlinear regression analysis
Gaussian fitting