基于蒙特卡罗的电子产品可靠性分析

Monte Carlo-based Reliability Analysis of Electronic Products

由于产品技术性能和结构要求等方面的提高,可靠性问题愈显突出,文章对电子元器件的可靠性进行了分析。寿命试验是可靠性试验中最重要最基本的项目之一,它是将产品放在特定的试验条件下考察其失效(损坏)随时间变化规律,寿命测试分析方法采用威布尔型分析方法,根据极大似然估计的不变原则,统计出元件的平均寿命的极大似然估计,另外采用指数分布,属于伽玛分布和威布尔分布的特殊情况,统计产品的偶然失效。实验仿真给出了数据,其目的在于提高电子产品的可靠性。

As the technical performance and structural requirements, etc. increase. Dependability prominent article on the reliability of electronic components were analyzed. Reliability life test is the most basic test of one of the most important, it is the product on a specific study of its failure under experimental conditions （damage） with time variation of weibull life test method, analysis method used, according to maximum likelihood estimation of the same principle, the statistics component of the average life span of maximum likelihood estimation, another exponential distribution, gamma and weibull distributions are special circumstances of the accidental failure of statistical products. Experimental simulation shows that the data, the aim of improving the protection of electronics.