摘要
电容式物位测量计测量导电介质时,测量的结果经常受到导电介质电极挂料的影响,分析了电极挂料产生的原因、挂料对测量结果的影响,提出了利用射频导纳技术解决挂料问题的工作原理,给出了射频导纳电容式物位测量系统的实施方案。
When the capacitance level meter measures the conductive medium,the measured results are easily influenced by its probe attachment.This paper tries to analyze the forming causation of probe attachment and its effect on measured results,puts forward the method to resolve the problem of probe attachment by the RF admittance technology and gives out the feasible scheme of the RF admittance capacitance level measuring system.
出处
《信息技术》
2010年第5期136-138,共3页
Information Technology
关键词
射频导纳
物位测量
电容式物位计
挂料
radio frequency admittance
material level measurement
capacitive level meter
probe attachment