高速互连中信号完整性测试单元分析

Analasis of detecting sensor for signal integrity faults in high-speed interconnect

介绍了高速互连中的信号完整性故障,主要探讨了由NMOS和PMOS管组成的内建高速互连检测单元,该单元用于对高速互连中的信号完整性故障进行测试。主要对已提出的2种故障检测单元进行了对比,分析了它们在信号完整性故障测试方面的不同特点,并用Hspice在有无噪声情况下进行了仿真,在理论分析和仿真结果方面显示了良好的一致性。

Describes the signal integrity failure in high-speed interconnect. Mainly discusses the transistors formed by the NMOS and PMOS, they are the built-in high-speed interconnect detector unit used for testing the signal integrity fault in the high-speed interconnect. There have been put forward two kinds of fault detection unit. We compare to the unit and analyze their different characteristics. Using Hspice to simulate the cells in circumstances with noise or not. The theoretical analysis and simulation results demonstrate that a good Consistency.