干涉成像光谱仪CCD象元响应非均匀性校正技术

Techniques for Pixel Response Nonuniformity Correction of CCD in Interferential Imaging Spectrometer

通过对星载可见光干涉成像光谱仪CCD象元响应非均匀性校正的相对辐射定标原理及所获定标数据的深入分析,研究出了一种适于对可见光及红外干涉成像光谱仪系统CCD象元响应非均匀性进行校正的方法,给出了探测器非均匀性大小对干涉图校正及光谱复原精度影响的定量关系,有效解决了干涉成像光谱仪系统探测器阵列非均匀性校正这一工程技术难题。在此基础上,提出了一种在仪器组装完成之后再进行定标及非均匀性校正的改进新方案,该方法省时省力省资金,不仅可以校正CCD本身的非均匀性,而且可校正干涉成像光谱仪系统其他原因引起的非均匀性,且定标数据也能根据系统工作环境变化而重新标定,能更有效地提高整个光谱仪系统非均匀性的校正精度。

Based on in-depth analysis of the relative radiation scaling theorem and acquired scaling data of pixel response nonuniformity correction of CCD （charge-coupled device） in spaceborne visible interferential imaging spectrometer,a pixel response nonuniformity correction method of CCD adapted to visible and infrared interferential imaging spectrometer system was studied out,and it availably resolved the engineering technical problem of nonuniformity correction in detector arrays for interferential imaging spectrometer system.The quantitative impact of CCD nonuniformity on interferogram correction and recovery spectrum accuracy was given simultaneously.Furthermore,an improved method with calibration and nonuniformity correction done after the instrument is successfully assembled was proposed.The method can save time and manpower.It can correct nonuniformity caused by other reasons in spectrometer system besides CCD itself’s nonuniformity,can acquire recalibration data when working environment is changed,and can also more effectively improve the nonuniformity calibration accuracy of interferential imaging spectrometer system.