摘要
本文介绍一种具有高性能和高可靠性的新型低压功率MOSFET——TI公司的NexFETTM,它将一种高可靠、高性能的RF LDMOSFET与齐纳二极管组合。基于MOSFET结构的RF LDMOSFET将品质因数(Ron*Qg)改善两倍。一个纵向集成的齐纳二极管钳制峰值开关节点电压的尖峰形成,从而使MOSFET免受击穿。
This article addresses a new lot-voltage power MOSFET with high-performance and excellent reliability. Tli-s NexFETTM marries a highly reliable, high-performance RF LDMOSFET with a Zener diode. The RF LDMOSFET-based MOSFET structure offers two times the improvement in figure of merit: Ron*Qg. An integrated vertical Zener diode clamp peaks switch node voltage spiking, thus, keeping the MOSFETs from breakdown.
出处
《电力电子》
2010年第2期48-50,共3页
Power Electronics