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NexFET:一种高可靠与高性能的低压功率DMOSFET 被引量:1

NexFET:A reliable high-performance low-voltage DMOSFET
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摘要 本文介绍一种具有高性能和高可靠性的新型低压功率MOSFET——TI公司的NexFETTM,它将一种高可靠、高性能的RF LDMOSFET与齐纳二极管组合。基于MOSFET结构的RF LDMOSFET将品质因数(Ron*Qg)改善两倍。一个纵向集成的齐纳二极管钳制峰值开关节点电压的尖峰形成,从而使MOSFET免受击穿。 This article addresses a new lot-voltage power MOSFET with high-performance and excellent reliability. Tli-s NexFETTM marries a highly reliable, high-performance RF LDMOSFET with a Zener diode. The RF LDMOSFET-based MOSFET structure offers two times the improvement in figure of merit: Ron*Qg. An integrated vertical Zener diode clamp peaks switch node voltage spiking, thus, keeping the MOSFETs from breakdown.
出处 《电力电子》 2010年第2期48-50,共3页 Power Electronics
关键词 NexFET MOSFET 齐纳二极管 电源管理 模拟 德州仪器(TI) NexFET MOSFET Zenner diode Power management Analog Texas Instruments(Tl)
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参考文献5

  • 1P. Rutter, et al, i °High Current Repetitive Avanlanche of Low Volt age Trench Power MOSFETsi±, IEEE ISPSD 2009, pp112-115.
  • 2I. Pawel, et al, i°Experimental Study and Simulation on Two Different Avalanche Mode in Trench Power MOSFETs", IET Circuits Devices Syst., Vol 1, No. 5, October 2007, pp341-346.
  • 3P. Moens, et al, "Hot-Carrier Degradation Phenomena in Lateral and Vertical DMOS Transistors," IEEE Trans. Electron Devices Vol. 51, No. 4, April 2004, pp623-628.
  • 4Shuming Xu(徐曙明), Jacek Korec, US Patent No: US 7,282,765, B2.
  • 5Shuming Xu(徐曙明), et al, "NexFET: A New Power Device", IEEE IEDM 2009, pp 145-148.

同被引文献16

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