摘要
分析了常见扫描链路配置中面临的问题,提出了一种扫描链配置方案。结合工程测试中出现的实际问题,给出了有关扫描链路配置的一些建议和注意事项。
The common problems in configuration of boundary scan chain are analyzed.Then a new configuration scheme of board level dynamic boundary scan chain is proposed.Some feasible suggestions and corrective measures are given based on summary to the practical problems in engineering test.
出处
《电光与控制》
北大核心
2010年第6期85-88,共4页
Electronics Optics & Control
关键词
集成电路
边界扫描
扫描链
测试
integrated circuit
boundary scan
scan chain
test
