基于测试数据分组合并的索引编码压缩方案

Index Coding Compression Scheme Based on Test Data Partition Merging

为降低集成电路的测试数据量,提出一种分组合并的索引编码压缩方案。该方案将原始测试集以固定宽度分组,根据相关性对每组测试字段进行群划分,选取若干较大的群,分别合并为标准字段存入解压结构的ROM中以备索引,并对测试字段进行索引编码。给出解压过程及实验结果,通过与其他编码方案的比较,证明该方案可行有效,且硬件开销较小。

In order to reduce the volume of IC test data, an index coding compression scheme based on test data partition merging is proposed. According to the scheme, the original test set is divided into blocks with fixed width, each block is divided into several groups according to relevance among test fields, several larger groups are picked out and merged into standard fields respectively, the standard fields are stored in the ROM of decompression structure for indexing, the test fields are encoded according to index. It describes the decompression process and provides experimental results. Compared with other scheme, it shows that the scheme is more feasible and effective, and the hardware cost is smaller.