摘要
An on-line full scan inspection system is developed for particle size analysis. A particle image is first obtained through optical line scan technology and is then analyzed using digital image processing. The system is composed of a particle separation module, an image acquisition module, an image processing module, and an electric control module. Experiments are carried out using non-uniform 0.1 mm particles. The main advantage of this system consists of a full analysis of particles without any overlap or miss, thus improving the Area Scan Charge Coupled Device （CCD） acquisition problems. Particle size distribution, roundness, and sphericity can be obtained using the system with a deviation of repeated precision of around ±1%. The developed system is shown to be also convenient and versatile for any particle size and shape for academic and industrial users.
An on-line full scan inspection system is developed for particle size analysis. A particle image is first obtained through optical line scan technology and is then analyzed using digital image processing. The system is composed of a particle separation module, an image acquisition module, an image processing module, and an electric control module. Experiments are carried out using non-uniform 0.1 mm particles. The main advantage of this system consists of a full analysis of particles without any overlap or miss, thus improving the Area Scan Charge Coupled Device （CCD） acquisition problems. Particle size distribution, roundness, and sphericity can be obtained using the system with a deviation of repeated precision of around ±1%. The developed system is shown to be also convenient and versatile for any particle size and shape for academic and industrial users.
