摘要
利用XIS的Cls携上峰,X线激发俄歇线形,XPS价带谱以及俄歇电子能谱的CKLL线形研究了几种碳材料的化学状态和电子结构.研究结果表明:XPS的携上效应可以鉴别不同结构的碳材料.XAES的化学位移和线形也可以有效地研究各种不同的碳材料的成键方式.XPS的价带谱也是研究固体表面电子结构的一种有效方法,对碳材料的研究也很有效.AES的CKLL俄歇线形非常适合金属碳化物的鉴别.
The chemical states and electronic structure of several carbon materials have been studied using the shake-up peaks of C 1s spectra, the C KLL auger line shapes excited by X-ray, the valence spectra of X-ray photoelectron spectroscopy and the C KLL line shapes of electron induced Auger electron spectroscopy. The results show that the shake-up peaks of C 1s can be used to distinguish the carbon species successfully, and provide chemical bond information. The chemical shift and line shape of X-ray indued Auger electron spectroscopy can distinguish the carbon species and sp2, sp3 hybridized bonds in carbon materials. The valence spectra can provide the messages of valence electron structure, and can also be used to identify the carbon species. The line shape of C KLL is depended on carbon species, which is very useful to identify the metal carbides in the interface reaction combining with depth profile technique of auger electron spectroscopy.
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
1999年第1期10-13,共4页
Chinese Journal of Analytical Chemistry
基金
国家教委留学回国人员启动基金
清华大学基础研究基金资助项目
关键词
电子能谱
线形分析
碳材料
XPS
AES
化学状态
X-ray photoelectron spectroscopy, auger electron spectroscopy, line shape analysis, carbon