高分子保护纳米粒子结构的扫描探针显微研究

Structure of polymer protected nanoparticles studied by scanning tunneling microscopy

高分子保护的纳米粒子的细致结构可以从扫描隧道显微镜（ＳＴＭ）图像中得到，单个粒子的横切图像分析中显示存在着一个中央峰和两个肩峰。通过与透射电镜结果的对比，证实两个肩峰是由于内部金属核心与外部高分子壳层间界面电阻的不连续变化所引起，在此基础上建立了一个简单的几何模型。

The fine structure of polymer protected nanoparticle can be derived from their scanning tunneling microscopy(STM) images.There exist a central peak and two side peaks in the cross sectional images of individual particle.By comparing with TEM results,we confirmed that the two side peaks are caused by the discontinuity of electric resistance between inner metal core and outer polymer shell.At last,a simple geometric model was proposed for the core shell structure.