摘要
用深能级瞬态光谱和光致发光(PL)方法研究了AlGaInP/GaAs异质结双极晶体管(HBT)发射区AlGaInP中的深能级.得到了两个深能级,分别为Ec-Et1=042eV和Ec-Et2=059eV,其复合截面为σn1=627×10-17cm2和σn2=649×10-20cm2.这两个深能级分别与硅杂质和氧杂质相联系.从不同激发功率与PL峰强度的关系,说明在AlGaInP中存在深能级非复合中心.AlGaInP/GaAsHBT发射区AlGaInP中深能级的存在使器件的电流增益减小.
Abstract
We have studied deep levels in AlGaInP emitter of AlGaInP/GaAs heterojunction bipolar
transistor by deep level transient spectroscopy and photoluminescence (PL) methods.Two deep
levels were obtained with thermal activation energies of E c- E t1 =0 42eV and E c- E t2
=0 59eV,whose capture cross sections are 6 27×10 -17 cm 2 and 6 49×10 -20 cm
2,where E t1 and E t2 are Si related and O related deep levels,respectively. The
relationship between excitation power and PL peak intensity have revealed that nonradiative
recombination centers of deep levels exist in AlGaInP. The current gain of AlGaInP/GaAs HBT
decreases due to the existence of deep levels in AlGaInP.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
1999年第3期556-560,共5页
Acta Physica Sinica
基金
国家自然科学基金
中国科学院红外物理国家重点实验室资助