摘要
带微处理器电路板的测试是电路板故障诊断中的一个重要课题,文章主要对含有微处理器的复杂电路的故障诊断方法及实现进行了研究,摒弃了过去进行测试程序开发时适配器结构复杂且通用性差、测试过程不易控制等特点。
The test circuit with micro processor circuit is an important topic in the fault diagnosis of circuit board.In this article,mainly study the fault diagnosis method and realization of complex circuit with microprocessor,improving versatility of ITA in the development of test program,and controllability of test procession.
出处
《电子质量》
2010年第6期10-12,共3页
Electronics Quality